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Test and Measurement Tips

How to use convolution to implement filters: part 2

March 27, 2025 By Rick Nelson

A moving-average filter can address white noise in the time domain but performs poorly in the frequency domain. In part 1 of this series, we defined convolution, denoted by the * symbol, and looked at a simple geometrical example of how it operates to produce a new function y(t) from two given functions, f(t) and […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

APEC 2025 test equipment: oscilloscopes and probes

March 26, 2025 By Martin Rowe

oscilloscope and probes in power electronics

Oscilloscopes and probes play a vital role for engineers designing and testing power electronics. Delivering electrical power to analog and digital circuits and systems is more than just DC measurements. That’s because nearly all power-converter circuits use switching techniques to maximize efficiency. Silicon carbide (SiC and gallium nitride (GaN) transistors, with their higher voltage and […]

Filed Under: APEC 2025, EMI/EMC/RFI, Events, Featured, Test and Measurement Tips Tagged With: cleverscope, keysighttechnologies, rohdeschwarz, tektronix, teledynelecroy, yokogawa

How to use convolution to implement filters: part 1

March 26, 2025 By Rick Nelson

Convolution is used in a variety of signal-processing applications, including time-domain-waveform filtering. In a recent series on the inverse fast Fourier transform (FFT), we concluded with a mention of convolution and its application to filtering. Convolution Q: What is convolution? A: Convolution, denoted by * symbol, combines two functions to form a third function in […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

Ethernet/LXI digitizers feature 12-bit resolution and up to 4.7 GHz bandwidth

March 25, 2025 By @syndication2023

Spectrum Instrumentation has introduced seven new digitizers in the DN2.33x series for signal acquisition and analysis in the GHz range. The devices connect via Ethernet/LXI interface to computers or networks and are designed for both R&D and industrial applications. The DN2.33x series digitizers utilize ADC technology with sampling rates between 3.2 GS/s and 10 GS/s, […]

Filed Under: Test and Measurement Tips Tagged With: spectruminstrumentation

Why engineers need IC ESD and TLP data

March 21, 2025 By Martin Rowe

Design Engineers need ESD and TLP characterization data to make informed decisions to design robust circuits and systems. When designing a circuit or system, engineers often review semiconductor data among several manufacturers. While two or more ICs may perform satisfactorily under normal operating conditions, they may not perform the same under extreme conditions such as […]

Filed Under: EMI/EMC/RFI, FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

Modular 4-channel power supply mounts in a test rack

March 10, 2025 By rtraiger

B&K Precision announces the MPS Series. This series delivers up to four output channels and 1200 W of power in a compact 1U mainframe. Users can configure a customized 1-to-4 channel DC power system by selecting from eight interchangeable modules. The modules support various voltage/current output ratings and are capable of generating 100 W (multi-range) […]

Filed Under: Test and Measurement Tips Tagged With: b&kprecision

What is second generation beamforming?

March 5, 2025 By Jeff Shepard

Second-generation beamforming refers to advanced designs using more sophisticated signal processing algorithms, larger antenna arrays, and the ability to generate higher quality, more focused beams that dynamically adapt to user movement and changing environments. This article looks at how basic beamforming works and how second-generation beamforming contributes to improved network efficiency. It closes by considering […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

How are NRZ and PAM different in an eye diagram?

March 3, 2025 By Rakesh Kumar, PhD

Eye diagrams are important tools in telecommunications for analyzing the performance of digital signals, such as noise, distortion, and intersymbol interference. This FAQ compares the non-return-to-zero (NRZ) and pulse modulation (PAM) formats, which are common ways of reading an eye diagram. NRZ represents binary data using two voltage levels, 0 and 1. This results in […]

Filed Under: Applications, FAQ, Featured, Telecommunications, Test and Measurement Tips, Wireless Tagged With: FAQ

Electrostatic Discharge (ESD): impacts and solutions

February 24, 2025 By Aharon Etengoff

Electrostatic discharge (ESD) disrupts the normal operation of electronic components and systems. It can cause leakages, shorts, gate oxide ruptures, junction and metallization burnouts, and deterioration of resistor-metal interfaces. To protect semiconductor devices from ESD, engineers integrate on-chip protective structures that shield core circuits’ input, output, and power supply pins. This article reviews the three […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

EMI from LED light fixture often exceeds regulatory limits

February 14, 2025 By Kenneth Wyatt

Conducted emissions from LED light fixtures at frequencies from 1 MHz to 30 MHz can interfere with amateur radio and several broadcast bands. Radiated emissions reach into the lower cellular bands. After recently moving to northern Colorado and setting up my EMC lab and amateur radio station in the basement, I wanted to update the […]

Filed Under: EMI/EMC/RFI, FAQ, Featured, Test and Measurement Tips Tagged With: siglenttechnologies, tekbox, wurthelectronik

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