Marvin Test Solutions, Inc. announced the release of the new GX3800e High Performance PXI Express FPGA module. The GX3800e employs the Altera Cyclone V FPGA, which supports data rates up to 3.125 Gb/s and features over 300,000 logic elements and 12.2 Kb of user memory. The GX3800e uses a daughter card for the I/O physical layer […]
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Missing Ocean Monitoring Instrument Found After Five Years at Sea
After going missing on Christmas Day five years ago, deep ocean measuring equipment belonging to the UK’s National Oceanography Centre (NOC) has just been found on a beach in Tasmania by a local resident after making an incredible 14,000 km journey across the ocean. In 2011, this deep-ocean lander instrument was deployed by NOC scientists […]
Rohde and Schwarz Seeks to Put Value in Test Instruments
The instruments engineers use for testing electronics systems, such as oscilloscopes and spectrum analyzers, face increasing challenges in meeting the high-frequency, high-throughput demands of increasingly sophisticated electronic end products. Customers are demanding higher levels of instrument performance and a more user-friendly interface, but don’t want to pay a premium in cost. Test equipment supplier Rohde […]
Economical Siglent SDS2000X-E 200/350 MHz Oscilloscopes
Saelig Co. Inc. announces the new economical, high performance SIGLENT SDS2000X-E Series Super Phosphor Oscilloscopes that are available in 200MHz and 350MHz bandwidths. They feature a maximum sampling rate of 2GSa/s and a standard record length of 28Mpts/ch (interleaved mode). With an impressive waveform capture rate of up to 400,000 frames/sec (sequence mode) Siglent’s newest oscilloscope series […]
Automotive Research User Handbook
This ebook includes a select set of examples curated to show how researchers and industrial partners are delivering on the innovation needed to change the world of transportation.
Leveraging COTS-Based Test Platforms for Next-Generation ATE Systems
Automated test equipment (ATE) systems are used to test the functionality and performance of electronic components, subassemblies, or complete functional systems at the time of production and/or during the life of the product to ensure operability. The requirements for testing the device, board, subassembly, or system will vary from simple to complex, and the approach […]
Verifying the True Jitter Performance of Clocks in High-Speed Digital Designs
As the data rates in high-speed digital designs increase, the limits for overall system jitter become tighter. This especially applies to the various components of the clock tree, where the jitter limits for reference clocks, clock buffers and jitter attenuators are even tighter. Due to their high phase noise sensitivity, phase noise analyzers are the […]
Hardware-in-the-Loop Testing Meets Wireless System Challenges
Recent years have brought many advancements for hardware-in-the-loop testing. Gone are the days when a single device could be connected at once and the amount of simulated wireless links couldn’t cover the number of antennas found in a modern day MIMO device. Modern channel emulators allow the connection of numerous devices simultaneously, but the number […]
Through Thick and Thin: Using XRF to Measure Coating Thickness
Handheld X-ray fluorescence (XRF) instruments report an element-by-element analysis of a material in a wide variety of applications such as alloys, precious metals, and geological samples. However, this technology can also be used to measure coating thicknesses with fast, portable, and nondestructive analysis. Benefits of Using XRF for Coating Measurement Accurate coating thickness measurements help […]
Deep Packet Inspection Engine Adds Secure Shell Classification
ipoque GmbH, a Rohde & Schwarz company, announced new Secure Shell (SSH) metadata extraction capabilities for its acclaimed R&S PACE 2 deep packet inspection (DPI) engine. These new enhancements enable its vendor customers to offer greater security for network services over unsecured IP networks. Optimal use of the SSH protocol requires proper configuration of parameters […]