This webinar was presented Thursday, December 10, 2020
Please click below to watch on demand
Are the bit errors in your data caused by the power supply or sources inside the digital channel? Let’s end the dispute by examining the connection between jitter and power integrity. We’ll highlight sources of noise likely to cause jitter on serial data lines and look at other power analysis methods from 3-phase inverter analysis to isolated probing.
Attendees of this webinar will learn how to:
- Detect ripple and its effects on a high-speed serial clock using power rail analysis software
- Mitigate signal integrity problems caused by the PDN (power distribution network)
- See how additional capabilities of modern oscilloscopes make complex power measurements easier and more repeatable
Featured Speakers:
Cameron Lowe
Field Applications Engineer
Tektronix
Field Applications Engineer
Tektronix
Lee Teschler
Executive Editor, Moderator
EE World
Executive Editor, Moderator
EE World
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