Keysight Technologies, Inc. says it has run successful inter-operability tests of its User Equipment (UE) Emulation Solution and Samsung’s new 5G base station based on 5G New Radio (NR) standards.
Keysight and Samsung have agreed to align their plans to enable 5G base station testing and build an ecosystem of interoperable products. Combining Samsung’s product portfolio with Keysight’s protocol, measurement, simulation and analysis expertise, the two companies are accelerating the development and deployment of 5G networks.
“Our new UE Emulation Solution clearly reflects the synergy of Keysight’s recent acquisition of Ixia,” said Giampaolo Tardioli, vice president, Network Access unit, Keysight. “This solution combines Keysight’s industry-leading RF measurement experience with Ixia’s best-in-class UE emulation framework to handle a wide range of demanding requirements and a variety of configurations for 5G.”
Samsung says its 5G Radio Base Station itself is a natural extension of today’s LTE small cells, designed to be installed in a dense configuration that allows for high network capacities. The system supports 28-GHz mmWave spectrum – a common frequency in leading 5G markets – and is capable of providing up to 10 Gbps among devices within its coverage range. With an emphasis on compact size and easy installation, Samsung says it aims to make 5G network deployments less resource-intensive compared to today’s LTE small cell deployments.
The Keysight 5G RF DVT Toolset is a network emulation solution for 5G radio design verification test. The new toolset cost-effectively scales from sub-6 GHz to mmWave, and from pre-5G standards to new radio (NR).
The 5G RF DVT Toolset is based on Keysight’s UXM 5G wireless test platform. The toolset is engineered to ensure measurement traceability—from early prototyping to acceptance and manufacturing.
The 5G RF DVT Toolset uses Keysight’s Test Automation Platform (TAP), allowing the design engineer to easily create and customize RF and radio resource management (RRM) test cases with the highest degree of parametrization.