When testing a device in a fixture, you can use transfer scattering parameters (T-parameters) to help remove the fixture’s contribution from your measurement result.
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What is de-embedding and how do I perform it (part 1)?
It’s a tenet of the test-and-measurement industry that you should concentrate on looking for defects in your device under test (DUT) — not in your test equipment. Figure 1 illustrates a common problem. An instrument presents an incorrect reading; in this case, an LRC meter or multimeter presents a resistance reading that’s about 5% low. […]
OFC 2023 round-up
The Optical Fiber Communications Conference (OFC) returned once again to provide a crucial platform for companies of the industry from around the globe. Taken place this past week, March 5th to 9th in San Diego, the annual exhibition and conference presented up-to-date techniques, materials, technologies, and applications in fiber optic technology. Below you will find…
Test applications handle automotive SerDes, MIPI A-PHY and ASA standards
New automotive serializer/deserializer (SerDes) transmit and channel test applications, as well as an automotive adapter portfolio to verify mobile industry processor interface (MIPI) A-PHY and Automotive SerDes Alliance (ASA) standards were developed by Keysight Technologies in collaboration with Sony Semiconductor Solutions Corp. and Rosenberger. High-speed automotive SerDes interfaces enable transport data streams to make in-vehicle […]
Learn these five basic RF measurements
Basic RF measurements go a long way toward characterizing today’s communication systems.
Future connectivity: More than just 5G
At the 2021 (virtual) IEEE Microwave Symposium, the industry looked at where wireless is going and how it will get beyond 5G.
Design software helps speed RF system, IC, module and board development
PathWave System Design 2022 and PathWave Advanced Design System (ADS) 2022 software speeds design development, as well as enhances performance and accuracy, through an integrated workflow that accelerates delivery of radio frequency (RF) systems, chips, modules and boards. Demand for wireless data and increasingly congested wireless spectrum requires RF design teams to work in a […]
Keysight acquires Sanjole, adds to wireless test portfolio
Keysight expands is wireless test offerings, moving into monitoring of RF and low-layer protocols.
Test system validates 400GE networks and devices
The new AresONE-S 400GE test system enables network equipment manufacturers and data center operators to validate complex, mixed 400 gigabit Ethernet (GE) and lower-speed networks and devices. Data center operators have widely deployed mature 100GE non-return-to-zero (NRZ)-based technologies. However, higher Ethernet speeds, such as 400GE, create new mixed signaling and forward error correction (FEC) implementations […]
Reference design based on 4-kW high-efficiency single-phase ac-dc evaluation board
A new power supply reference design enables engineers to identify and correct design errors before building hardware, thereby lowering product costs and speeding time to market. Switched-mode power supplies provide greater efficiency, increased power density and lower overall system costs when using GaN devices. However, GaN, a high switching speed, high performance wide bandgap semiconductor, […]
