Keysight Technologies, Inc. announced that its collaboration with Marvin Test Solutions, Inc. (MTS) – a supplier of functional test solutions – has resulted in the development of a fast and accurate 5G semiconductor manufacturing test platform. The two parties focused on advancing beamformer integrated circuit (IC) test technology to help manufacturers of semiconductors accelerate the…
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Keysight’s 5G conformance testing for 5G selected by testing laboratory
Keysight Technologies announced that the company’s 5G conformance test solutions have been selected by Korea Testing Laboratory (KTL) for global 5G new radio (NR) device certification. KTL, an internationally renowned certification body, selected Keysight’s 5G solutions for 5G NR device testing related to 5G radio frequency (RF) and protocol conformance validation as specified by 3GPP. Keysight’s 5G solutions…
Advanced photonics on-wafer testing system delivers automated alignment, simultaneous optical-optical and optical-electrical device tests
An advanced photonics on-wafer testing solution delivers industry-first capabilities including automated alignment, simultaneous optical-optical and optical-electrical device tests. The joint solution — offered by CompoundTek and developed by that company in cooperation with Keysight Technologies Inc., and FormFactor, Inc. — includes: The FormFactor CM300xi-SiPh, with automated wafer-level photonics positioning combined with Keysight’s industry-standard IL/PDL engines […]
Testers boost throughput, operational efficiency of PCB assembly manufacturing
The i3070 Series 6 In-Circuit Test (ICT) suite of solutions enables electronics manufacturers to improve test throughput and the operational efficiency of their printed circuit board assembly (PCBA) manufacturing. Electronics manufacturers for the 5G, internet of things (IoT), and the automotive and energy industries are faced with a highly complex, connected global manufacturing environment. As […]
What are the applications and measurements of S-parameters? (Part 2)
Part 1 of this FAQ was a basic introduction to the context and concept of s-parameters. Part 2 looks at their measurement and application and relationship to the time domain. Q: How do you actually measure s-parameters? A: In general, except for approximate measurements, you cannot use a spectrum analyzer alone for this frequency-domain test. […]
Test gear generates modern EW RF environments
New electronic warfare (EW) threat simulation solutions include software and hardware that generate modern EW radio frequency (RF) environments to enable engineers to easily and efficiently test their EW systems. Threat simulation technologies must be able to replicate realistic EMS environments to validate EW system capabilities and identify potential risks. To address a growing range […]
What are the functions and principles of S-parameters (Part 1)?
As design frequencies now routinely go into the hundreds of MHz and tens of GHz range, conventional voltage and current measurements are not useful, but scattering (s) parameters can fully characterize the RF component or path performance. For engineers with experience focused from DC to several hundred megahertz, it is usually sufficient to characterize components […]
High-performance PXE EMI receiver intercepts 44-GHz signals
The N9048B PXE Electromagnetic Interference (EMI) Receiver has been extended to 44 GHz, enabling customers to meet current and emerging compliance testing requirements according to various standards bodies, including MIL-STD-461G and FCC Part 15. The cellular (5G) and automotive industries must leverage higher frequencies to deliver new applications requiring increased spectrum resources to carry large […]
Design/test software suite optimized for 5G, IoT, automotive uses
PathWave Test 2020 includes PathWave Desktop Edition and PathWave Test Automation which leverages the OpenTAP open-source test sequencer. For design verification, validation, and test engineers under extreme deadline pressures, the PathWave Test 2020 suite supports efficient test flows including shared data and analysis for making fast, informed decisions. Developed on the Keysight PathWave software platform, […]
Integrated test package for industrial devices aligned with Avnu Alliance Qvb test plan
A new set of industrial time-sensitive networking (TSN) conformance test cases in IxNetwork from Ixia enable device manufacturers to ensure their devices are in compliance with the Avnu Alliance industrial test plan for 802.1Qbv-2015. In the industrial market, the evolution of the industrial internet of things (IIoT) will increase the amount of data harvested through […]