Test equipment plays a major role in product development and production, which was apparent at IMS 2023. In the photos and videos below, you’ll get a taste of test developments at RF, mmWave, and sub-THz frequencies. This year, D-band (110 GHz to 170 GHz) seized a larger portion of the exhibit hall than in past […]
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EE World’s 2023 communications handbook is here
Our 2023 5G, Wired, & Wireless Handbook is now available in ebook form. Download your copy today. It started on a cold January day with an editorial call. A month later, the abstracts came in. After another month, the manuscripts came in. Then came the editing and some back-and-forth with the authors. Next, it was…
What is jitter and what can I do about it (part 1 of 2)?
Measuring and quantifying jitter are the first steps toward controlling it. Jitter is a measure of the timing performance of a digital data stream such as Ethernet, USB, PCIe, or HDMI. It defines when data transitions occur in relation to an ideal waveform. Excess jitter can lead to signal-integrity problems that result in high bit-error […]
EE World’s 2023 communications handbook is here
Our 2023 5G, Wired, & Wireless Handbook is now available in ebook form. Download your copy today. It started on a cold January day with an editorial call. A month later, the abstracts came in. After another month, the manuscripts came in. Then came the editing and some back-and-forth with the authors. Next, it was…
What is de-embedding and how do I perform it (part 2)?
When testing a device in a fixture, you can use transfer scattering parameters (T-parameters) to help remove the fixture’s contribution from your measurement result.
Experiments bring hope for 6G above 100 GHz
Efforts to explore and “unlock” this frequency region require an interdisciplinary approach with high-frequency RF semiconductor technology. The THz region also shows great promise for many application areas ranging from imaging to spectroscopy to sensing.
Channel-sounding measurements: Part of active 6G research
Universities and industry engineers strive to understand how sub-THz signal behave in the real world.
Test gear checks out Wi-Fi 7 chipsets
An automated test solution checks out Broadcom Wi-Fi 7 chipsets, the industry’s first Wi-Fi 7 chipsets optimized for mobile handsets that also support simultaneous dual-band 2×2 IEEE 802.11be-compliant operation. Rohde & Schwarz collaborated with Broadcom to successfully verify the R&S CMP180 next generation wireless device test platform for R&D and production. The IEEE 802.11be amendment […]
Test gear speeds EMC tests under real driving conditions
New test gear supports automated testing with simulation of real driving conditions while covering typical automotive standards. The AVL PUMA 2 automation controls the test cycle and stores the measured data, in synchronization with the R&S ELEKTRA EMC test software to exchange information between the testbed and the EMC measurement equipment. The ELEKTRA software has […]
RF power sensors handle up to 90 GHz
New R&S NRP90S and R&S NRP90SN power sensors from Rohde & Schwarz combine an extraordinary frequency range of 50 MHz to 90 GHz with a dynamic range from -70 dBm to 20 dBm along with high measurement speeds of 50,000 measurements per second. Compared to current thermal power sensors for measurements over 67 GHz, the […]