• Skip to primary navigation
  • Skip to main content
  • Skip to primary sidebar
  • Skip to footer

Electrical Engineering News and Products

Electronics Engineering Resources, Articles, Forums, Tear Down Videos and Technical Electronics How-To's

Rick Nelson

How to choose analog-signal-chain components: part 1

July 10, 2025 By Rick Nelson

Signal conditioning can prepare a sensor’s output for digitization. In a previous series, we looked at the analog-to-digital converter (ADCs) and sources of error that occur within the device. Of course, errors can creep in upstream of the ADC along the analog signal chain as the signal to be digitized is acquired and conditioned. Q: […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

Understanding ADC specs and architectures: part 5

June 26, 2025 By Rick Nelson

ENOB describes an analog-to-digital converter’s performance with respect to total noise and distortion. In the earlier parts of this series on analog-to-digital converters (ADCs), we looked at the basics (part 1); gain error, offset error, and differential nonlinearity (part 2); and integral nonlinearity (part 3); and then we looked at some ADC topologies and introduced […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

Understanding ADC specs and architectures: part 4

May 28, 2025 By Rick Nelson

The AC performance of an analog-to-digital converter depends on its architecture. In part 3 of this series, we discussed the integral nonlinearity (INL) error of an analog-to-digital converter (ADC), noting that gain, offset, and INL error all contribute to the total unadjusted error. This metric provides an overall view of an ADC’s DC performance. Q: What about the AC […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

Understanding ADC specs and architectures: part 3

May 22, 2025 By Rick Nelson

Integral nonlinearity tracks the cumulative effects of an ADC’s differential nonlinearity. In part 2 of this series, we discussed several sources of error in an analog-to-digital converter (ADC), including gain, offset, missing-code error, and differential nonlinearity (DNL). We concluded with an illustration of a waveform with varying levels of DNL superimposed on the staircase representing […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

Understanding ADC specs and architectures: part 2

May 20, 2025 By Rick Nelson

Specifications such as gain error, offset error, and differential nonlinearity help define an analog-to-digital converter’s performance. In part 1 of this series, we discussed an ideal analog-to-digital converter (ADC), noting that it would have infinite resolution and bandwidth. Then we looked at the real world of practical inverters and how their resolution, expressed in a […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

Understanding ADC specs and architectures: part 1

April 28, 2025 By Rick Nelson

Analog-to-digital converters are the heart of most test equipment, setting the stage for the digital processing of analog signals. Several posts over the past year or so have involved digital signal processing. For example, we have covered the fast Fourier transform (FFT), the inverse FFT, and discrete convolution. To perform these operations on real-world signals, […]

Filed Under: Analog IC Tips, Artificial intelligence, Data Converters, FAQ, Featured Tagged With: FAQ

How to use convolution to implement filters: part 4

April 8, 2025 By Rick Nelson

A windowed sinc function can implement a low-pass filter, and a two-dimensional convolutional filter can blur or sharpen images. In part 3 of this series, we introduced a low-pass filter based on the Sinc function and described the need for windowing to compensate for sampling and truncation. Q: How can we apply this filter? A: […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

How to use convolution to implement filters: part 3

March 28, 2025 By Rick Nelson

A windowed sinc filter outperforms a moving-average filter in the frequency domain. In part 2 of this series, we described a type of convolution filter called the moving-average filter, and we demonstrated that it is effective at removing Gaussian white noise in the time domain but performs poorly in the frequency domain. Q: Do all […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

How to use convolution to implement filters: part 2

March 27, 2025 By Rick Nelson

A moving-average filter can address white noise in the time domain but performs poorly in the frequency domain. In part 1 of this series, we defined convolution, denoted by the * symbol, and looked at a simple geometrical example of how it operates to produce a new function y(t) from two given functions, f(t) and […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

How to use convolution to implement filters: part 1

March 26, 2025 By Rick Nelson

Convolution is used in a variety of signal-processing applications, including time-domain-waveform filtering. In a recent series on the inverse fast Fourier transform (FFT), we concluded with a mention of convolution and its application to filtering. Convolution Q: What is convolution? A: Convolution, denoted by * symbol, combines two functions to form a third function in […]

Filed Under: FAQ, Featured, Test and Measurement Tips Tagged With: FAQ

  • Page 1
  • Page 2
  • Page 3
  • Interim pages omitted …
  • Page 6
  • Go to Next Page »

Primary Sidebar

EE Engineering Training Days

engineering

Featured Contributions

zonal architecture

Addressing zonal architecture challenges in the automotive industry

How Li-ion batteries are powering the shift in off-highway equipment

Bipolar junction transistors show their muscle

IEEE Phased Array 2024: what we saw

Wi-Fi 7 and 5G for FWA need testing

More Featured Contributions

EE Tech Toolbox

“ee
Tech Toolbox: 5G Technology
This Tech Toolbox covers the basics of 5G technology plus a story about how engineers designed and built a prototype DSL router mostly from old cellphone parts. Download this first 5G/wired/wireless communications Tech Toolbox to learn more!

EE Learning Center

EE Learning Center
“ee
EXPAND YOUR KNOWLEDGE AND STAY CONNECTED
Get the latest info on technologies, tools and strategies for EE professionals.
“bills
contribute

R&D World Podcasts

R&D 100 Episode 10
See More >

Sponsored Content

Designing for Serviceability: The Role of Interconnects in HVAC Maintenance

From Control Boards to Comfort: How Signal Integrity Drives HVAC Innovation

Built to Withstand: Sealing and Thermal Protection in HVAC Sub-Systems

Revolutionizing Manufacturing with Smart Factories

Smarter HVAC Starts at the Sub-System Level

Empowering aerospace E/E design and innovation through Siemens Xcelerator and Capital in the Cloud

More Sponsored Content >>

RSS Current EDABoard.com discussions

  • CT
  • connector model question
  • Earth leakage circuit with TL071
  • Step Up Push Pull Transformer design / construction
  • current distribution on resonant mode in anapole resoantor question

RSS Current Electro-Tech-Online.com Discussions

  • More fun with ws2812 this time XC8 and CLC
  • I Wanna build a robot
  • Pickit 5
  • Pic18f25q10 osccon1 settings swordfish basic
  • The Analog Gods Hate Me
Search Millions of Parts from Thousands of Suppliers.

Search Now!
design fast globle

Footer

EE World Online

EE WORLD ONLINE NETWORK

  • 5G Technology World
  • Analog IC Tips
  • Battery Power Tips
  • Connector Tips
  • DesignFast
  • EDABoard Forums
  • Electro-Tech-Online Forums
  • Engineer's Garage
  • EV Engineering
  • Microcontroller Tips
  • Power Electronic Tips
  • Sensor Tips
  • Test and Measurement Tips

EE WORLD ONLINE

  • Subscribe to our newsletter
  • Teardown Videos
  • Advertise with us
  • Contact us
  • About Us

Copyright © 2025 · WTWH Media LLC and its licensors. All rights reserved.
The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media.

Privacy Policy