• Skip to primary navigation
  • Skip to main content
  • Skip to primary sidebar
  • Skip to footer

Electrical Engineering News and Products

Electronics Engineering Resources, Articles, Forums, Tear Down Videos and Technical Electronics How-To's

  • Products / Components
    • Analog ICs
    • Battery Power
    • Connectors
    • Microcontrollers
    • Power Electronics
    • Sensors
    • Test and Measurement
    • Wire / Cable
  • Applications
    • 5G
    • Automotive/Transportation
    • EV Engineering
    • Industrial
    • IoT
    • Medical
    • Telecommunications
    • Wearables
    • Wireless
  • Learn
    • eBooks / Handbooks
    • EE Training Days
    • Tutorials
    • Learning Center
    • Tech Toolboxes
    • Webinars & Digital Events
  • Resources
    • White Papers
    • Design Guide Library
    • Digital Issues
    • Engineering Diversity & Inclusion
    • LEAP Awards
    • Podcasts
    • DesignFast
  • Videos
    • EE Videos and Interviews
    • Teardown Videos
  • EE Forums
    • EDABoard.com
    • Electro-Tech-Online.com
  • Bill’s Blogs
  • Advertise
  • Subscribe

VeEX adds MPLS-TP and CPRI rate test modules

December 18, 2013 By Brian Santo

VeEX now has available two new modules for its TX300 test set, one for MPLS-TP, which is becoming increasingly popular for performing cellular backhaul, the other for CPRI.

The former can be used to test implementations of Multi-Protocol Label Switching Transport Profile (MPLS-TP). The latter addresses Common Public Radio Interface (CPRI) rates from 614.4 Mbps to 9.8304 Gbps.

MPLS-TP, a Layer 2 packet-based transport mechanism, is gaining momentum as a transport of choice for access and aggregation networks requiring a technology that combines the operational simplicity of packet switched networks with the operations, administration and maintenance (OAM) tools and fault resiliency capabilities of circuit switched networks.

A key application of MPLS-TP is mobile backhaul transport, as it is able to efficiently handle multiple classes of service, while providing simple provisioning and fault resiliency features needed for backhaul of 3G/4G LTE cell sites.

The TX300 offers the tool set for testing multiple classes of MPLS-TP traffic, measuring QoS parameters while simultaneously validating OAM functionalities. Available as a software upgrade option for the TX300 platform, the capabilities include:

  • MPLS-TP line rate traffic generation on any test port from 10BaseT up to 10G Ethernet
  • Support for LSP and Pseudowire
  • Dual Port MPLS-TP traffic generation
  • MPLS-TP traffic analysis, including all SLA key parameters (frame loss, delay, jitter, etc.)
  • MPLS-TP support for all Ethernet tests: RFC2544, V-SAM (Y.1564), Multi-stream throughput test and BERT
  • OAM support per ITU-T G.8113.1

Complementary to the TX300 platform’s extensive set of mobile backhaul testing capabilities, VeEX has also increased its support for mobile front haul technology with support for CPRI testing.

The CPRI software option for the TX300 provides service assurance verification for the CPRI Physical layer between the Radio Equipment Controller (REC) and the Radio Equipment (RE). It includes Bit Error Rate (BER) testing capabilities and latency measurement on rates from 614.4 Mbps to 9.8304 Gbps.

You Might Also Like

Filed Under: Telecommunications, Wire and Cable Tips

Primary Sidebar

EE Engineering Training Days

engineering

Featured Contributions

GaN reliability milestones break through the silicon ceiling

From extreme to mainstream: how industrial connectors are evolving to meet today’s harsh demands

The case for vehicle 48 V power systems

Fire prevention through the Internet

Beyond the drivetrain: sensor innovation in automotive

More Featured Contributions

EE Tech Toolbox

“ee
Tech Toolbox: Internet of Things
Explore practical strategies for minimizing attack surfaces, managing memory efficiently, and securing firmware. Download now to ensure your IoT implementations remain secure, efficient, and future-ready.

EE Learning Center

EE Learning Center
“ee
EXPAND YOUR KNOWLEDGE AND STAY CONNECTED
Get the latest info on technologies, tools and strategies for EE professionals.
“bills

R&D World Podcasts

R&D 100 Episode 10
See More >

Sponsored Content

Advanced Embedded Systems Debug with Jitter and Real-Time Eye Analysis

Connectors Enabling the Evolution of AR/VR/MR Devices

Award-Winning Thermal Management for 5G Designs

Making Rugged and Reliable Connections

Omron’s systematic approach to a better PCB connector

Looking for an Excellent Resource on RF & Microwave Power Measurements? Read This eBook

More Sponsored Content >>

RSS Current EDABoard.com discussions

  • Inverting OpAmp - basic circuit question
  • Colpitts oscillator
  • BOM sent to Contract assemblers doesnt correspond to schem
  • Amperage changes in DC-DC conversion
  • I/O constraint for Hold check

RSS Current Electro-Tech-Online.com Discussions

  • stud mount Schottky diodes
  • LED circuit for 1/6 scale diorama
  • using a RTC in SF basic
  • Hi Guys
  • Can I use this charger in every country?
Search Millions of Parts from Thousands of Suppliers.

Search Now!
design fast globle

Footer

EE World Online

EE WORLD ONLINE NETWORK

  • 5G Technology World
  • Analog IC Tips
  • Battery Power Tips
  • Connector Tips
  • DesignFast
  • EDABoard Forums
  • Electro-Tech-Online Forums
  • Engineer's Garage
  • EV Engineering
  • Microcontroller Tips
  • Power Electronic Tips
  • Sensor Tips
  • Test and Measurement Tips

EE WORLD ONLINE

  • Subscribe to our newsletter
  • Teardown Videos
  • Advertise with us
  • Contact us
  • About Us

Copyright © 2025 · WTWH Media LLC and its licensors. All rights reserved.
The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media.

Privacy Policy