Engineers can use AI/ML to reduce test development time, analyze test data from manufacturing, automate visual inspection and calibration, and identify counterfeit components. Here’s how some do it. Testing takes too much time; just ask any … [Read More...] about Engineers use AI/ML to improve test
Main Content
FROM THE EDITORS
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Aimee Kalnoskas
Motor control suite supports 30 W to 750 W applications -
Martin Rowe
How to calculate and apply an inverse FFT: part 1 -
Emma Lutjen
ATE test contactors for Analog/RF/MMWave device testing -
Bill Schweber
FAQ on intrinsically safe systems: part 2 -
Jeff Shepard
What are the EMC issues for 5G and IoT devices? -
Rick Nelson
How to calculate and apply an inverse FFT: part 2 -
Kenneth Wyatt
Free and low-cost online EE tools aid in design -
Rakesh Kumar, PhD
Design challenges for solar photovoltaic arrays operating in partially shaded environments -
Aharon Etengoff
How to test IoT device wireless capabilities
FAQs
FAQ on intrinsically safe systems: part 2
Potentially explosive hazardous environments demand intrinsically safe electronics Part 1 provided an overview of intrinsically safe systems; this part looks at some of the electronics and … Read about FAQ on intrinsically safe systems: part 2
What are the EMC issues for 5G and IoT devices?
5G and IoT applications can involve high-density devices operating on similar frequencies. Designers of electronic devices regularly pay close attention to minimizing the generation of … Read about What are the EMC issues for 5G and IoT devices?
What are the connector challenges in hypersonic missiles?
Connectors in hypersonic missiles need to be small and lightweight and provide robust signal integrity for high-speed connectivity. The challenge is to provide the required performance and … Read about What are the connector challenges in hypersonic missiles?
How to test IoT device wireless capabilities
Testing the wireless capabilities of IoT devices before production helps ensure reliable connectivity, optimal performance, and seamless integration across a wide range of applications. This … Read about How to test IoT device wireless capabilities
Focus on Analog ICs
EE Training Days kicks-off 2025 with The A to Z of Multi-die Design
Did you know that multi-die architectures now represent over 50% of new semiconductor designs, marking a significant shift in chip development strategy? It’s true. There’s now a clear trend towards … [Read More...] about EE Training Days kicks-off 2025 with The A to Z of Multi-die Design
How hardware-assisted verification (HAV) transforms EDA workflows
Many semiconductor companies rely on hardware-assisted verification (HAV) to optimize sophisticated monolithic system-on-chip (SoC) designs and chiplet architectures. HAV streamlines verification and … [Read More...] about How hardware-assisted verification (HAV) transforms EDA workflows
Focus on Microcontrollers
Runtime monitoring tool captures core dumps in embedded systems
Percepio introduces Detect software for embedded systems and edge device testing, bringing continuous observability to development workflows. The tool extends existing Continuous Integration and … [Read More...] about Runtime monitoring tool captures core dumps in embedded systems
Memory stack design reaches 4 TB/s bandwidth with eight dies
Numem will be at the upcoming Chiplet Summit to showcase its high-performance solutions. By accelerating the delivery of data via new memory subsystem designs, Numem solutions are re-architecting the … [Read More...] about Memory stack design reaches 4 TB/s bandwidth with eight dies
Focus on Power Electronics
Step-down converter achieves 220 μA quiescent current at 600 mA output
Nexperia introduced a new series of step-down DC-DC converters featuring devices with outstanding stand-by and operating efficiency that offer engineers even greater flexibility for designing various fixed and portable battery-powered applications … [Read More...] about Step-down converter achieves 220 μA quiescent current at 600 mA output
Band-pass filters handle 8 W power in 3 mm package
KYOCERA AVX released two new series of compact, thin-film band-pass filters engineered to deliver excellent RF performance in a wide range of high-power applications with crowded PCBs. Designed to satisfy cross-market customer demand for small, … [Read More...] about Band-pass filters handle 8 W power in 3 mm package
Focus on 5G
What are the EMC issues for 5G and IoT devices?
5G and IoT applications can involve high-density devices operating on similar frequencies. Designers of electronic devices regularly pay close attention to minimizing the generation of electromagnetic interference (EMI) and ensuring electromagnetic … [Read More...] about What are the EMC issues for 5G and IoT devices?
10 GHz RF cables feature double shields
Fairview Microwave has launched a line of TCOM cable assemblies. They are designed to deliver outstanding RF performance with options tailored for either low-loss or low-PIM configurations, depending on the connector type. The TCOM cable assemblies … [Read More...] about 10 GHz RF cables feature double shields
Focus on Test & Measurement
Free and low-cost online EE tools aid in design
Downloadable and online free and low-cost EE tools help engineers design and analyze circuits. The internet is full of EE tools from equipment manufacturers, semiconductor manufacturers, independent EEs and hobbyists. Some are web-based that you can use with just a browser. Some you need to download and install on your PC while others you install […]
1 mm cable supports RF testing to 110 GHz
Pasternack has announced the launch of its new 1.0mm test cable assemblies. These cables deliver exceptional performance in high-frequency environments up to 110 GHz, addressing the critical needs of industries such as telecommunications, aerospace, and defense, where precision and durability are paramount. The new line is designed for rigorous testing applications, offering signal clarity and […]
Embedded Systems
Runtime monitoring tool captures core dumps in embedded systems
Percepio introduces Detect software for embedded systems and edge device testing, bringing continuous observability to development workflows. The tool extends existing Continuous Integration and Continuous Testing processes by implementing runtime … [Read More...] about Runtime monitoring tool captures core dumps in embedded systems
Embedded computing series integrates four 2.5 GbE network ports
Advantech has introduced two AI-integrated desktop platforms: the Mini-ITX AIMB-2710 and Micro-ATX AIMB-589. These platforms use Intel® Core™ Ultra Processors (Series 2) S-Series, integrating an NPU capable of 36 TOPS for AI acceleration. The … [Read More...] about Embedded computing series integrates four 2.5 GbE network ports
Podcasts
Tescan’s UniTOM HR is focus of Episode 9 of R&D 100 – The Podcast
R&D World editors Paul Heney and Aimee Kalnoskas are back, and this time they’re talking about a lot of news, in addition to the technology of the day. First, they delve into some important updates about the R&D 100 Awards for 2023 — and then dip their toes into the strange new world of AI […]
