To provide BEV and HEV designers with a faster and more reliable high-voltage circuit protection solution, Microchip Technology announces the E-Fuse Demonstrator Board, enabled by silicon carbide (SiC) technology, available in six variants for 400–800 V battery systems and with a current rating up to 30 amps.
The E-Fuse demonstrator can detect and interrupt fault currents in microseconds, 100–500 times faster than traditional mechanical approaches because of its high-voltage solid-state design. The fast response time substantially reduces peak short-circuit currents from tens of kilo-amps to hundreds of amps, which can prevent a fault event from resulting in a hard failure.
With the E-Fuse demonstrator’s resettable feature, designers can easily package an E-Fuse in the vehicle without the burden of design-for-serviceability constraints. This reduces design complexities and enables flexible vehicle packaging to improve BEV/HEV power system distribution.
OEMs can accelerate the development of SiC-based auxiliary applications with the E-Fuse demonstrator because of the built-in Local Interconnect Network (LIN) communication interface. The LIN interface enables the configuration of the over-current trip characteristics without the need to modify hardware components, and it also reports diagnostic status.
The E-Fuse demonstrator leverages the unrivaled ruggedness and performance of Microchip’s SiC MOSFET technology and PIC microcontrollers’ Core Independent Peripherals (CIPs) with a LIN-based interface. The companion components are automotive-qualified and yield a lower part count and higher reliability over a discrete design.
The E-Fuse Demonstrator Board is supported by MPLAB X Integrated Development Environment (IDE) to enable customers to quickly develop or debug software. The LIN Serial Analyzer development tool allows customers to easily send and receive serial messages from a PC to the E-Fuse Demonstrator Board.
The E-Fuse Demonstrator Board is available in limited sampling upon request.