The new DataStudio design-to-test data analytics solution provides the foundation for a modern, secure, scalable engineering data infrastructure and applications, accelerating the pace of innovation for wireless, semiconductor, and electronics innovators. Consistent with the need to fast-track product development, DataStudio bridges critical data across the semiconductor design and test workflow. DataStudio Specification Compliance Manager (SCM), […]
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Battery test system boosts safety, performance of electric vehicles
A new Battery Test System (BTS) for electric vehicle (EV) testing is designed to help tier-one suppliers and automakers adapt to the complexity and scale of EV battery testing through enhanced customization, automation, and connection of data across the entire battery test workflow to ensure performance and accelerate time to market. Batteries are at the…
Here’s a rundown on free layout/PCB software
There are dozens of free PCB-layout and schematic packages available on the Web. Often they are stripped-down versions of more complex packages available for licensing. Often, the process of upgrading from freeware to more sophisticated versions is pretty easy. If your circuit needs are generally confined to relatively straightforward two-layer boards, here are a few […]
PXI chassis sports two slots
NI’s first two-slot PXI chassis delivers a small, cost-effective package. Modular hardware like PXI enables a software-connected workflow to achieve better results. PXI hardware delivers openness, software options, modularity and I/O coverage for projects developing adaptive and scalable systems. PXI uses commercial PC-based PCI and PCI Express bus technology while combining rugged CompactPCI modular packaging, as […]
ADAS recording takes shape of storage-as-a-service offering
A new collaboration aims to enhance data storage and transfer services, including a first-of-its-kind advanced driver-assistance systems (ADAS) record offering. The new ADAS record offering combines National Instrument’s high-performance in-vehicle data logging systems with Seagate’s data transfer and edge storage services, enabling original equipment manufacturers (OEMs) and suppliers to efficiently leverage data to ensure the […]
Say goodbye to National Instruments, hello to “NI”
National Instruments today announced an updated brand identity including a new logo, visual identity, enhanced digital experiences and a brand campaign celebrating engineers and engineering firms that “Engineer Ambitiously.” The company is now known simply as NI. One reason: NI vice president of global marketing Shelley Gretlein said the word “National” in the company name […]
Hardware-in-the-loop systems speed electric vehicle development tasks
New solutions for hardware-in-the-loop (HIL) validation of electric vehicle (EV) powertrain components equip engineers with the ability to modify and extend test systems more quickly and efficiently than they can with traditional fixed-function test systems delivered by turnkey vendors. This approach can help accelerate time to market through the flexibility to scale system performance and […]
Radar test system optimized for automotive ADAS apps
A 4-GHz Vehicle Radar Test System (VRTS) helps engineers test advanced driver assistance systems (ADAS) by simulating objects in a repeatable and accurate way. The massive automotive industry shift towards 79 GHz radar has reduced the cost of radar-based safety features like autonomous emergency braking (AEB) and rear cross-traffic alert (RCTA). The main advantage of […]
Test setup wrings out computing platforms for autonomous vehicles
A new test setup is designed to put the computing platform for autonomous vehicles (AVs) through its paces. AVs are among the most complex systems being tested today. At the heart of the AV is a powerful computing platform that analyzes the environment around the vehicle and determines the appropriate action to help ensure the […]
Test system software enhancements help improve semiconductor production test efficiency
New Semiconductor Test System (STS) software enhancements deliver significant improvements to the programming and debugging experience, test execution speed, parallel test efficiency and overall equipment efficiency for the NI Semiconductor Test System. As market windows constrict, semiconductor production test engineers are trying to accelerate the process of developing, debugging and deploying new test programs to […]
