When you are trying to get an accurate idea of waveform qualities from a scope display, the display settings are quite important. So it can be helpful to review the setup process in widely used scopes such as a Tektronix MDO3000. Display style and persistence in this instrument can be accessed by pressing the Acquire […]
Basic and advanced modes in the Tektronix AFG31000 Series arbitrary function generator
Early signal generators, dependent upon vacuum-tube technology and subject to failure, were ancestors of today’s far more precise and durable arbitrary function generators. These instruments have advanced modes and functions that figure prominently in research and product development as well as troubleshooting and repair. Here the word “arbitrary” means the instrument is capable of generating […]
Tektronix signal separation software earns 2019 Leap Award
The votes are in. Business-to-Business publisher WTWH Media, LLC, has announced the winners of the second-year Leadership in Engineering Achievement Program (LEAP) Awards, a design engineering product competition honoring the most exciting new products in a host of technology areas: Additive Manufacturing, Advanced Materials, Analog Electronics, Connectivity, Embedded Computing, Fastener Technology, Hydraulics, Industrial Automation, Mechanical, […]
What are the applications and measurements of S-parameters? (Part 2)
Part 1 of this FAQ was a basic introduction to the context and concept of s-parameters. Part 2 looks at their measurement and application and relationship to the time domain. Q: How do you actually measure s-parameters? A: In general, except for approximate measurements, you cannot use a spectrum analyzer alone for this frequency-domain test. […]
SMU modules handle tests involving low current, high capacitance
Two new source measure unit (SMU) modules for the Keithley 4200A-SCS Parameter Analyzer can perform low-current measurements even in the presence of high load capacitance due to long cables and complex test setups. Among the notable test applications facing this challenge are LCD display manufacturing and nano FET device testing on a chuck. The new […]
Checking power line quality with test instruments
The average homeowner probably doesn’t think about the quality of the electrical power coming out of household wall sockets. But that’s not the case for large industrial facilities where capacitive, inductive, and non-linear electrical loads can be large enough to distort the ac waveform. In those cases, electrical power quality becomes an important measurement. Electric […]
Understanding instrumentation for measuring total harmonic distortion
When discussing total harmonic distortion (THD), the fundamental of the wave in question is known as the first harmonic. Quantifying THD, therefore, begins with the second harmonic. Theoretically, the number of harmonics is limited only by some maximum frequency based on minimum quantum wavelength. In reality, however, we are interested in a relatively small number […]
Software speeds double-pulse testing with AFGs
A new software plugin for the AFG31000 Arbitrary/Function Generator makes it possible to perform crucial double pulse testing in less than a minute, saving a significant amount of time when compared to alternative methods. With the new Double Pulse Test software, engineers can quickly define pulse parameters from a single window on the AFG31000’s large […]
Basic instrumentation for the electronics workbench
Engineers and technicians doing design, development, and testing have a wide range of instrumentation available for use on the test bench. So it might be useful to consider which instruments are considered the “basics” for the general case. Here are a few nominations along with the device properties that are generally considered “must-haves.” The unassuming […]
New approach to frequency analysis on oscilloscopes
It has often been the case that optimizing scope setting to display a detailed view of an FFT results in a time-domain view that is suboptimal. Not anymore. Gary Waldo, Tektronix The debugging of embedded systems often involves looking for clues that are hard to discover when examined one domain at a time. The ability […]
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